00533nam a2200181Ia 4500 SGT 9788172248918 621.3815 ABR Abramovici, Miron Digital systems testing and testable design Jaico Publishing House Delhi 2009 652p. ELECTRONICS LOGIC SIMULATION, TESTING FOR SINGLE STUCK FAULTS, TESTING FOR BRIDGING FAULTS, DESIGN FOR TESTABILITY Breuer, Melvin Friedman,Arthur ddc BK 0 0 ddc 0 0 FE FE 2010-05-14 SGTU 0 621.3815 ABR FE2568 2015-02-09 00:00:00 2015-02-09 BK 0 0 ddc 0 0 FE FE 2010-05-14 SGTU 0 621.3815 ABR FE2569 2015-02-09 00:00:00 2015-02-09 BK 0 0 ddc 0 0 FE FE 2012-09-06 SGTU 0 621.3815 ABR FE5492 2015-02-09 00:00:00 2015-02-09 BK 0 0 ddc 0 0 FE FE 2012-09-06 SGTU 0 621.3815 ABR FE5493 2015-02-09 00:00:00 2015-02-09 BK 5109 5109